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"Consistent algorithms for multi-label classification with macro-at-k metrics."
Erik Schultheis et al. (2024)
- Erik Schultheis, Wojciech Kotlowski, Marek Wydmuch, Rohit Babbar, Strom Borman, Krzysztof Dembczynski:
Consistent algorithms for multi-label classification with macro-at-k metrics. ICLR 2024
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