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"The Application of Independent Component Analysis Method on the Mura ..."

Xin Bi, Xiaoping Xu, Jinhua Shen (2014)

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DOI: 10.1007/978-3-319-13963-0_33

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Xin Bi, Xiaoping Xu, Jinhua Shen:
The Application of Independent Component Analysis Method on the Mura Defect Inspection of LCD Process. ICIRA (2) 2014: 321-330

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