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"High-quality depth map up-sampling robust to edge noise of range sensors."

Daeyoung Kim, Kuk-Jin Yoon (2012)

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DOI: 10.1109/ICIP.2012.6466919

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-24

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Daeyoung Kim, Kuk-Jin Yoon:
High-quality depth map up-sampling robust to edge noise of range sensors. ICIP 2012: 553-556

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