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"Neural netwok based X-ray tomography for fast inspection of apples on a ..."

Eline Janssens et al. (2015)

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DOI: 10.1109/ICIP.2015.7350933

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Eline Janssens, Jan De Beenhouwer, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers:
Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. ICIP 2015: 917-921

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