"Printed Circuit Board Defect Detection Based on Improved YOLOv5."

Tong Yang et al. (2023)

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DOI: 10.1109/ICICT58900.2023.00019

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-06

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Tong Yang, Yuguo Liu, Changxin Jin, Kai Jiang, Qiang Duan, Chen Song, Qibin Chen, Xue Li, Junzheng Ge, Rui Li:
Printed Circuit Board Defect Detection Based on Improved YOLOv5. ICICT 2023: 72-77

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