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"Electrical characterization of process induced effects on non-silicon devices."
Chadwin D. Young et al. (2018)
- Chadwin D. Young
, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila
, Peng Zhao, Ava Khosravi, Israel Mejia
, Manuel Quevedo-Lopez, Christopher L. Hinkle
, Robert M. Wallace:
Electrical characterization of process induced effects on non-silicon devices. ICICDT 2018: 173-176
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