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"Toward Reliable Extraction of the Properties of Border Traps in Lateral ..."
Ruiyuan Yin et al. (2019)
- Ruiyuan Yin, Yue Li, Wei Lin, Cheng P. Wen, Yilong Hao, Yunyi Fu, Maojun Wang:
Toward Reliable Extraction of the Properties of Border Traps in Lateral GaN Power MOSFET with a Distributed Network Model. ICICDT 2019: 1-3
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