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"Characterization and modeling of charge trapping: From single defects to ..."

Tibor Grasser et al. (2014)

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DOI: 10.1109/ICICDT.2014.6838620

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-13

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Tibor Grasser, Gerhard Rzepa, Michael Waltl, Wolfgang Goes, Karina Rott, Gunnar Andreas Rott, Hans Reisinger, Jacopo Franco, Ben Kaczer:
Characterization and modeling of charge trapping: From single defects to devices. ICICDT 2014: 1-4

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