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"Defect Detection in Random Colour Textures Using the MIA T2 ..."

Fernando López-García et al. (2006)

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DOI: 10.1007/11867661_68

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  dblp key:
  - conf/iciar/LopezPFV06
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Fernando López-García, José Manuel Prats-Montalbán, Alberto Ferrer, José Miguel Valiente:
Defect Detection in Random Colour Textures Using the MIA T² Defect Maps. ICIAR (2) 2006: 752-763

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