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"Acceleration of RAM-Tests with Associative Pattern Recognition Methods."

Djamshid Tavangarian, Christian Elm (1991)

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DOI: 10.1007/978-3-642-76930-6_17

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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  dblp key:
  - conf/icftcs/TavangarianE91
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  - https://dblp.org/rec/conf/icftcs/TavangarianE91
Djamshid Tavangarian, Christian Elm:
Acceleration of RAM-Tests with Associative Pattern Recognition Methods. Fault-Tolerant Computing Systems 1991: 193-204

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