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"Systematische Erweiterung der Selbsttestmöglichkeiten von Baugruppen ..."

Z. Benyò (1987)

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DOI: 10.1007/978-3-642-45628-2_16

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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  dblp key:
  - conf/icftcs/Benyo87
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  - https://dblp.org/rec/conf/icftcs/Benyo87
Z. Benyò:
Systematische Erweiterung der Selbsttestmöglichkeiten von Baugruppen mit Mikroprozessoren. Fehlertolerierende Rechensysteme 1987: 176-190

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