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"Data Value Assessment in Semiconductor Production: An Empirical Study to ..."

Ziba Yusufi et al. (2022)

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DOI: 10.1145/3537693.3537725

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-25

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  dblp key:
  - conf/iceeg/YusufiPKKL22
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  - https://dblp.org/rec/conf/iceeg/YusufiPKKL22
Ziba Yusufi, Simon J. Preis, Daniel Kraus, Udo Kruschwitz, Bernd Ludwig:
Data Value Assessment in Semiconductor Production: An Empirical Study to Define and Quantify the Value of Data. ICEEG 2022: 207-214

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