"Yield-Driven Redundant Via Insertion Based on Probabilistic Via-Connection ..."

Jin-Tai Yan, Bo-Yi Chiang, Zhi-Wei Chen (2006)

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DOI: 10.1109/ICECS.2006.379928

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Jin-Tai Yan, Bo-Yi Chiang, Zhi-Wei Chen:
Yield-Driven Redundant Via Insertion Based on Probabilistic Via-Connection Analysis. ICECS 2006: 874-877

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