"Variability of nanoscale triple gate FinFETs: Prediction and analysis method."

Dimitrios H. Tassis et al. (2014)

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DOI: 10.1109/ICECS.2014.7050084

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-04

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Dimitrios H. Tassis, Ioannis Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis:
Variability of nanoscale triple gate FinFETs: Prediction and analysis method. ICECS 2014: 710-713

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