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"Non-robust delay test pattern enhancement."

Volker Meyer, Walter Anheier, Arne Sticht (2002)

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DOI: 10.1109/ICECS.2002.1046194

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-15

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  dblp key:
  - conf/icecsys/MeyerAS02
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Volker Meyer, Walter Anheier, Arne Sticht:
Non-robust delay test pattern enhancement. ICECS 2002: 453-456

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