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"Non-robust delay test pattern generation based on stuck-at TPG."

Volker Meyer, Walter Anheier, Arne Sticht (2001)

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DOI: 10.1109/ICECS.2001.957645

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-18

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  - conf/icecsys/MeyerAS01
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Volker Meyer, Walter Anheier, Arne Sticht:
Non-robust delay test pattern generation based on stuck-at TPG. ICECS 2001: 1007-1010

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