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"ESD test methods on integrated circuits: an overview."

Ming-Dou Ker, Jeng-Jie Peng, Hsin-Chin Jiang (2001)

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DOI: 10.1109/ICECS.2001.957647

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-18

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  dblp key:
  - conf/icecsys/KerPJ01
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Ming-Dou Ker, Jeng-Jie Peng, Hsin-Chin Jiang:
ESD test methods on integrated circuits: an overview. ICECS 2001: 1011-1014

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