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"Tamper Resistivity Analysis for Nano-meter LSI with Process Variations."

Makoto Ikeda, Hiroshi Yamauchi, Kunihiro Asada (2006)

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DOI: 10.1109/ICECS.2006.379806

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  dblp key:
  - conf/icecsys/IkedaYA06
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Makoto Ikeda, Hiroshi Yamauchi, Kunihiro Asada:
Tamper Resistivity Analysis for Nano-meter LSI with Process Variations. ICECS 2006: 387-390

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