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"New test pattern generation units for NPSF oriented memory built-in self test."
A. Chrisanthopoulos et al. (2001)
- A. Chrisanthopoulos, Th. Haniotakis, Y. Tsiatouhas, Angela Arapoyanni:
New test pattern generation units for NPSF oriented memory built-in self test. ICECS 2001: 749-752
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