Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Sub-electron CIS noise analysis in 65 nm process."

Raffaele Capoccia, Assim Boukhayma, Christian C. Enz (2016)

> Home

Details and statistics

DOI: 10.1109/ICECS.2016.7841263

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icecsys/CapocciaBE16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icecsys/CapocciaBE16
Raffaele Capoccia, Assim Boukhayma, Christian C. Enz:
Sub-electron CIS noise analysis in 65 nm process. ICECS 2016: 560-563

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.