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"Yield model characterization for analog integrated circuit using ..."

Sawal Ali et al. (2008)

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DOI: 10.1109/ICECS.2008.4675065

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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Sawal Ali, Reuben Wilcock, Peter R. Wilson, Andrew D. Brown:
Yield model characterization for analog integrated circuit using Pareto-optimal surface. ICECS 2008: 1163-1166

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