"Test-driven development of consumer electronics device drivers: A ..."

Seehwan Yoo, Young-Pil Kim (2015)

> Home

Details and statistics

DOI: 10.1109/ICCE.2015.7066459

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iccel/YooK15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccel/YooK15
Seehwan Yoo, Young-Pil Kim:
Test-driven development of consumer electronics device drivers: A user-level device driver approach. ICCE 2015: 392-394

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.