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"Improving the ESD Robustness of an Ultra-high Voltage nLDMOS Device with ..."
Po-Lin Lin et al. (2020)
- Po-Lin Lin, Shen-Li Chen, Sheng-Kai Fan, Tien-Yu Lan, Yu-Jie Zhou, Shi-Zhe Hong:
Improving the ESD Robustness of an Ultra-high Voltage nLDMOS Device with the Embedded Schottky Diode. ICCE-TW 2020: 1-2

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