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"A robust method of IC seating inspection in burn-in sockets using Hough ..."

Tsuneo Kagawa, Masaya Ikemoto, Satoshi Ohtake (2022)

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DOI: 10.1109/ICCE-TAIWAN55306.2022.9869228

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-09

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  dblp key:
  - conf/icce-tw/KagawaIO22
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  - https://dblp.org/rec/conf/icce-tw/KagawaIO22
Tsuneo Kagawa, Masaya Ikemoto, Satoshi Ohtake:
A robust method of IC seating inspection in burn-in sockets using Hough transform. ICCE-TW 2022: 1-2

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