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"Design on ESD robustness of source-side discrete distribution in the 60-V ..."

Shen-Li Chen et al. (2016)

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DOI: 10.1109/ICCE-TW.2016.7521041

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-29

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Shen-Li Chen, Chih-Hung Yang, Chih-Ying Yen, Kuei-Jyun Chen, Yi-Cih Wu, Jia-Ming Lin:
Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices. ICCE-TW 2016: 1-2

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