"Intelligent backtracking in test generation for combinational circuits."

W. B. Zeng, D. Z. Wei (1989)

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DOI: 10.1109/ICCD.1989.63326

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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W. B. Zeng, D. Z. Wei:
Intelligent backtracking in test generation for combinational circuits. ICCD 1989: 48-51

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