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"Scheduling unequal length tests in high performance VLSI system ..."

John Y. Sayah, Charles R. Kime (1989)

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DOI: 10.1109/ICCD.1989.63429

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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John Y. Sayah, Charles R. Kime:
Scheduling unequal length tests in high performance VLSI system implementations. ICCD 1989: 566-570

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