"An Efficient Interconnect Test Using BIST Module in a Boundary-Scan ..."

Hyunjin Kim, Jongchul Shin, Sungho Kang (1999)

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DOI: 10.1109/ICCD.1999.808562

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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Hyunjin Kim, Jongchul Shin, Sungho Kang:
An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. ICCD 1999: 328-329

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