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"Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor."
Joel Grodstein et al. (2003)
- Joel Grodstein, Dilip K. Bhavsar, Vijay Bettada, Richard A. Davies:
Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor. ICCD 2003: 180-186
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