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"Reliability Analysis for Embedded System with Two Types of Faults and ..."

Madhu Jain, Manju Kaushik, Gireesh Kumar (2015)

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DOI: 10.1145/2818567.2818656

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-17

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Madhu Jain, Manju Kaushik, Gireesh Kumar:
Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process. ICCCT 2015: 271-275

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