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"Error Catch and Analysis for Semiconductor Memories Using March Tests."
Chi-Feng Wu et al. (2000)
- Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-Liang Cheng, Cheng-Wen Wu:
Error Catch and Analysis for Semiconductor Memories Using March Tests. ICCAD 2000: 468-471
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