"Fast physics-based electromigration analysis for multi-branch interconnect ..."

Xiaoyi Wang et al. (2017)

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DOI: 10.1109/ICCAD.2017.8203775

access: closed

type: Conference or Workshop Paper

metadata version: 2018-04-09

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  - https://dblp.org/rec/conf/iccad/WangYHTCY17
Xiaoyi Wang, Yan Yan, Jian He, Sheldon X.-D. Tan, Chase Cook, Shengqi Yang:
Fast physics-based electromigration analysis for multi-branch interconnect trees. ICCAD 2017: 169-176

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