"Deep submicron defect detection with the energy consumption ratio."

Bapiraju Vinnakota (1999)

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DOI: 10.1109/ICCAD.1999.810695

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Bapiraju Vinnakota:
Deep submicron defect detection with the energy consumption ratio. ICCAD 1999: 467-470

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