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"A Parametric Test Method for Analog Components in Integrated Mixed-Signal ..."

Michael Pronath, Volker Gloeckel, Helmut E. Graeb (2000)

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DOI: 10.1109/ICCAD.2000.896531

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/iccad/PronathGG00
Michael Pronath, Volker Gloeckel, Helmut E. Graeb:
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits. ICCAD 2000: 557-561

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