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"Testing methods for detecting stuck-open power switches in coarse-grain ..."

Szu-Pang Mu et al. (2010)

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DOI: 10.1109/ICCAD.2010.5654118

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/iccad/MuWYCCTT10
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia-Tso Chao, Shi-Hao Chen, Chih-Mou Tseng, Tsung-Ying Tsai:
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs. ICCAD 2010: 155-161

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