BibTeX record conf/iccad/MaoGGC90

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@inproceedings{DBLP:conf/iccad/MaoGGC90,
  author    = {Weiwei Mao and
               Ravi K. Gulati and
               Deepak K. Goel and
               Michael D. Ciletti},
  title     = {{QUIETEST:} {A} Quiescent Current Testing Methodology for Detecting
               Leakage Faults},
  booktitle = {{IEEE/ACM} International Conference on Computer-Aided Design, {ICCAD}
               1990, Santa Clara, CA, USA, November 11-15, 1990. Digest of Technical
               Papers},
  pages     = {280--283},
  publisher = {{IEEE} Computer Society},
  year      = {1990},
  url       = {https://doi.org/10.1109/ICCAD.1990.129902},
  doi       = {10.1109/ICCAD.1990.129902},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/conf/iccad/MaoGGC90.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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