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"Exploring linear structures of critical path delay faults to reduce test ..."

Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou (2006)

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DOI: 10.1145/1233501.1233523

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/LuHL06
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/LuHL06
Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou:
Exploring linear structures of critical path delay faults to reduce test efforts. ICCAD 2006: 100-106

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