"A delay metric for RC circuits based on the Weibull distribution."

Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert (2002)

> Home

Details and statistics

DOI: 10.1145/774572.774664

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-23

- view
  authority control:
- export record
  dblp key:
  - conf/iccad/LiuKA02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccad/LiuKA02
Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert:
A delay metric for RC circuits based on the Weibull distribution. ICCAD 2002: 620-624

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.