"PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage ..."

Subed Lamichhane et al. (2023)

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DOI: 10.1109/ICCAD57390.2023.10323686

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-03

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Subed Lamichhane, Wentian Jin, Liang Chen, Mohammadamir Kavousi, Sheldon X.-D. Tan:
PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage Physics-Informed Neural Networks. ICCAD 2023: 1-9

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