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"HierPINN-EM: Fast Learning-Based Electromigration Analysis for ..."

Wentian Jin et al. (2022)

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DOI: 10.1145/3508352.3549371

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-19

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  dblp key:
  - conf/iccad/JinCLKT22
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/JinCLKT22
Wentian Jin, Liang Chen, Subed Lamichhane, Mohammadamir Kavousi, Sheldon X.-D. Tan:
HierPINN-EM: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnects Using Hierarchical Physics-Informed Neural Network. ICCAD 2022: 28:1-28:9

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