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"Allocation of State Retention Registers Boosting Practical Applicability ..."

Gyoung-Hwan Hyun, Taewhan Kim (2019)

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DOI: 10.1109/ICCAD45719.2019.8942064

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-19

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  dblp key:
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Gyoung-Hwan Hyun, Taewhan Kim:
Allocation of State Retention Registers Boosting Practical Applicability to Power Gated Circuits. ICCAD 2019: 1-6

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