"DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits."

Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners (1991)

Details and statistics

DOI: 10.1109/ICCAD.1991.185229

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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