Stop the war!
Остановите войну!
for scientists:
default search action
"Test generation for bridging faults in CMOS ICs based on current ..."
Uwe Gläser et al. (1994)
- Uwe Gläser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold:
Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. ICCAD 1994: 36-39
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.