"A KPI-related multiplicative fault diagnosis scheme for industrial processes."

Haiyang Hao et al. (2013)

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DOI: 10.1109/ICCA.2013.6565167

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-28

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Haiyang Hao, Kai Zhang, Steven X. Ding, Zhiwen Chen, Yaguo Lei, Zhikun Hu:
A KPI-related multiplicative fault diagnosis scheme for industrial processes. ICCA 2013: 1460-1465

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