"Model-Based Sensitivity Analysis of Nondestructive Testing Systems Using ..."

Jethro Nagawkar et al. (2020)

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DOI: 10.1007/978-3-030-50426-7_6

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-19

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Jethro Nagawkar, Leifur Leifsson, Roberto Miorelli, Pierre Calmon:
Model-Based Sensitivity Analysis of Nondestructive Testing Systems Using Machine Learning Algorithms. ICCS (5) 2020: 71-83

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