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"Deep Learning-Based Industry Product Defect Detection with Low False ..."

Tsukasa Ueno, Qiangfu Zhao, Shota Nakada (2020)

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DOI: 10.1109/ICAST51195.2020.9319407

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-02

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  dblp key:
  - conf/icawst/UenoZN20
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Tsukasa Ueno, Qiangfu Zhao, Shota Nakada:
Deep Learning-Based Industry Product Defect Detection with Low False Negative Error Tolerance. iCAST 2020: 1-6

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