"A model of VLSI interconnect test based on boundary scan."

Yang Jiangping, Li Guixiang, Wang Wanglei (2004)

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DOI: 10.1109/ICARCV.2004.1468887

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Yang Jiangping, Li Guixiang, Wang Wanglei:
A model of VLSI interconnect test based on boundary scan. ICARCV 2004: 557-561

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