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"Wafer Die Position Detection Using Hierarchical Gray Level Corner Detector."

Jae Hyung Na, Hae-Seok Oh (2004)

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DOI: 10.1007/978-3-540-24844-6_115

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  dblp key:
  - conf/icaisc/NaO04
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Jae Hyung Na, Hae-Seok Oh:
Wafer Die Position Detection Using Hierarchical Gray Level Corner Detector. ICAISC 2004: 748-753

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