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"Efficient test scheduling for reusable BIST in 3D stacked ICs."

Navya Mohan et al. (2017)

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DOI: 10.1109/ICACCI.2017.8126028

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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  dblp key:
  - conf/icacci/MohanKRMS17
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  - https://dblp.org/rec/conf/icacci/MohanKRMS17
Navya Mohan, Maya Krishnan, Sudhir Kumar Rai, M. MathuMeitha, S. Sivakalyan:
Efficient test scheduling for reusable BIST in 3D stacked ICs. ICACCI 2017: 1349-1355

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