"An input test pattern for characterization of a full-adder and n-bit ..."

Manan Mewada, Mazad Zaveri (2016)

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DOI: 10.1109/ICACCI.2016.7732055

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Manan Mewada, Mazad Zaveri:
An input test pattern for characterization of a full-adder and n-bit ripple carry adder. ICACCI 2016: 250-255

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